BAS standards at public enquiry

Institute for Standardization of Bosnia and Herzegovina, on the proposal of BAS technical committees, announces a public enquiry on draft national standards (stage code 40.20).

Deadline for submission of comments on draft national standards is 60 days from the publication of the enquiry on the Institute's website (if necessary, it can be shortened to no less than 30 days).

The drafts of BAS standards are available to our stakeholders via online module for reading the draft of BAS standards, and basic information about the draft (title, scope, technical committee that prepared the draft for public discussion, etc.) is available on the ISBIH website. 

The request for access to the draft BAS standard at the public enquiry should be sent to email: stand@isbih.gov.ba. To be able to access the online module for reading the draft BAS standards, you must be registered on our website.

Written comments on the draft national standards (with the designation of BAS technical committee and the reference designation of the BAS draft standards) shall be submitted to the Institute. 

To fill this form correctly, see the Comment Form Use Guide.

Showing 41-60 of 315 items.
Standard referenceStage codeBAS/TCReal dateForseen date for next stage code
   
nsBAS EN 71-2+A1:2026
Safety of toys - Part 2: Flammability
40.20BAS/TC 5427.03.202626.05.2026
nsBAS EN 71-3+A2:2026
Safety of toys - Part 3: Migration of certain elements
40.20BAS/TC 5427.03.202626.05.2026
nsBAS EN 71-4+A1:2026
Safety of toys - Part 4: Experimental sets for chemistry and related activities
40.20BAS/TC 5427.03.202626.05.2026
nsBAS EN 71-7:2026
Safety of toys - Part 7: Finger paints - Requirements and test methods
40.20BAS/TC 5427.03.202626.05.2026
nsBAS EN IEC 60127-9:2026
Miniature fuses - Part 9: Miniature fuse-links for special applications with partial-range breaking capacity
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60255-26:2026
Measuring relays and protection equipment - Part 26: Electromagnetic compatibility requirements
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60255-27:2026
Measuring relays and protection equipment - Part 27: Product safety requirements
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60269-1:2026
Low-voltage fuses - Part 1: General requirements
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60269-3:2026
Low-voltage fuses - Part 3: Supplementary requirements for fuses for operation by unskilled persons (fuses mainly for household and similar applications) - Examples of standardized systems of fuses A to F
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60269-4:2026
Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60269-7:2026
Low-voltage fuses - Part 7: Supplementary Requirements for fuse-links for the protection of batteries and battery systems
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60404-18:2026
Magnetic materials - Part 18: Permanent magnet (magnetically hard) materials - Methods of measurement of the magnetic properties in an open magnetic circuit using a superconducting magnet
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60747-16-7:2026
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-8:2026
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-9:2026
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-10:2026
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-28:2026
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-34-1:2026
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-37:2026
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-39:2026
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
40.20BAS/TC 6426.02.202626.04.2026