BAS standards at public enquiry

Institute for Standardization of Bosnia and Herzegovina, on the proposal of BAS technical committees, announces a public enquiry on draft national standards (stage code 40.20).

Deadline for submission of comments on draft national standards is 60 days from the publication of the enquiry on the Institute's website (if necessary, it can be shortened to no less than 30 days).

The drafts of BAS standards are available to our stakeholders via online module for reading the draft of BAS standards, and basic information about the draft (title, scope, technical committee that prepared the draft for public discussion, etc.) is available on the ISBIH website. 

The request for access to the draft BAS standard at the public enquiry should be sent to email: stand@isbih.gov.ba. To be able to access the online module for reading the draft BAS standards, you must be registered on our website.

Written comments on the draft national standards (with the designation of BAS technical committee and the reference designation of the BAS draft standards) shall be submitted to the Institute. 

To fill this form correctly, see the Comment Form Use Guide.

Showing 1-20 of 90 items.
Standard referenceStage codeBAS/TCReal dateForseen date for next stage code
   
nsBAS EN IEC 60747-16-7:2026
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-8:2026
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-9:2026
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-10:2026
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-28:2026
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-34-1:2026
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-37:2026
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-39:2026
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-5:2026
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61031:2026
Nuclear facilities - Instrumentation and control systems - Design, location and application criteria for installed area gamma radiation dose rate monitoring equipment for use during normal operation and anticipated operational occurrences
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61098:2026
Radiation protection instrumentation - Installed personnel surface contamination monitors
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61124:2026
Reliability testing - Compliance tests for constant failure rate and constant failure intensity
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61162-1:2026
Maritime navigation and radiocommunication equipment and systems - Digital interfaces - Part 1: Single talker and multiple listeners
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61162-2:2026
Maritime navigation and radiocommunication equipment and systems - Digital interfaces - Part 2: Single talker and multiple listeners, high-speed transmission
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61162-450:2026
Maritime navigation and radiocommunication equipment and systems - Digital interfaces - Part 450: Multiple talkers and multiple listeners - Ethernet interconnection
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61188-6-3:2026
Circuit boards and circuit board assemblies - Design and use - Part 6-3: Land pattern design - Description of land pattern for through hole components (THT)
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61189-2-501:2026
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-501: Test methods for materials for interconnection structures - Measurement of resilience strength and resilience strength retention factor of flexible dielectric materials
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61189-2-720:2026
Test methods for electrical materials, circuit boards and other interconnection structures and assemblies - Part 2-720: Detection of defects in interconnection structures by measurement of capacitance
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61189-2-801:2026
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-801: Thermal conductivity test for base materials
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61189-2-803:2026
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-803: Test methods for Z-axis expansion of base materials and printed boards
40.20BAS/TC 6426.02.202626.04.2026