nsBAS EN IEC 62496-2-5:2024

This part of IEC 62496-2 defines a test method for folding flexibility inspection of flexible opto-electric circuits with a MIT folding endurance tester and presents a guideline for a step stress test method for finding the predetermined minimum mechanical folding radii below which the flexible opto-electric circuits can be damaged by intended folding distortion. Here, test samples are used instead of products for the flexibility test of their flexible opto-electric circuits, and the test samples have the same layer structure as the products.