BAS IEC 61000-4-29:2003
Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques; Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
General Information
Status: Withdrawn
No. of pages: 37
Language: English
Edition: 1.
Adoption method: Endorsment
Publication date: 14.11.2003
Technical committee:
ICS:
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Abstract
Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports.
This standard defines:
- the range of test levels;
- the test generator;
- the test set-up;
- the test procedure.
Lifecycle
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Original document and degree of correspondence
- IEC 61000-4-29:2000, identical