BAS ISO 18118:2025
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
General Information
Status: Published
No. of pages: 26
Language: English
Edition: 3.
Adoption method: Republication
Publication date: 23.05.2025
Technical committee:
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Abstract
This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.
Lifecycle
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Original document and degree of correspondence
- ISO 18118:2024, identical